Abstract
This paper presents an all-digital built-in-self-test (BIST) scheme to quickly test the duty cycle corrector (DCC) with de-skew circuit in NAND Flash memory. The proposed BIST circuit adopts an adjustable duty cycle module to generate the input signal of DCC, then it utilizes a high-resolution vernier time-to-digital converter to quantify the pulse widths related to duty cycle and phase difference into digital codes. The proposed BIST scheme can quickly obtain accurate measurement results of the input/output duty cycle of DCC and the phase difference of signals without using high-precision test equipment, it is a low-cost built-in testing solution for NAND Flash memory. The test chip is fabricated using 130 nm CMOS process. The area occupies 0.0425 mm2, and the proposed circuit consumes 2 mW when supply voltage is 1.2 V and clock frequency is 1 GHz. The experimental results show that the measurement error of duty cycle is in the range of −0.85% to 1.5% and the measurement error of phase difference is within ±6 ps.
Published Version
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