An Algorithmic Approach to Observed Single Event Effects in Van Allen Probes Solid State Recorders

Abstract

A new algorithmic approach yields insights into the relationship between predicted and on-orbit synchronous dynamic random access memory (SDRAM) error rates on the Van Allen Probes. This article describes more than 5.5 years of data on Solid State Recorder Single Event Effects (SEEs) from December 4, 2012 to June 30, 2018. We compare observations with predictions from the early spacecraft design and give reasons for the large overpredictions. We analyze observed SEEs versus L-shell position and the memory device location on the Solid State Recorder electronic card. We examine the differences among the outlying SEE-susceptible devices on the two spacecraft. The inflight results demonstrate the conservatism of the predictions for the overall upset rate.