Abstract
Since FinFET -based circuits have been proven to have better stability at low supply voltages than planar transistor-based circuits, designers are expected to use a wide range of supply voltages for FinFET -based circuits to manage power requirements. Therefore, it is important to investigate the soft error performance over a range of supply voltages. In this work, soft error Failure-in- Time (FIT)rates of D-Flip-Flop (D-FF)designs in 16-nm and 7-nm bulk FinFET technologies are characterized with alpha particle irradiations. Results show that the rate of increase in FIT rates for 7 -nm FF designs are significantly higher, on average, than those for 16-nm FF designs as supply voltage is reduced.
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