Abstract

Ambipolar organic thin-film transistors (TFTs) based on a fluorinated copper phthalocyanine (F16CuPc)∕copper phthalocyanine (CuPc) homostructure layer were fabricated and characterized. The homostructure TFTs showed typical air-stable ambipolar characteristics, with hole and electron mobilities of 1.44×10−3 and 9.97×10−4cm2∕Vs, respectively, which are comparable to unipolar mobilities in these single-layer devices. X-ray diffraction analysis suggests highly ordered F16CuPc and CuPc polycrystalline thin films could be continuously grown via an intermediate-phase layer in the homostructure.

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