Aging-Aware Instruction-Level Statistical Dynamic Timing Analysis for Embedded Processors

Abstract

CMOS miniaturization and timing faults due to factors, such as aging, emphasize that embedded processor reliability is a major concern. Among the various aging mechanisms, negative bias temperature instability (NBTI) is encountered as the dominant factor. Techniques against NBTI are mostly based on aggressive $V_{\text {dd}}$ scaling, decelerating aging at the expense of performance degradation. Traditionally, designers use conservative guard-bands to combat timing faults, leading to loss of efficiency. Some other reactive approaches use sensors, requiring hardware modification and large area and debug overheads. According to the literature, two opportunities exist to compensate for the performance loss: instruction timing slacks imposed by static timing analysis (STA) and application computational error resiliency. This article proposes an efficient estimation model for the instruction-level timing slack probability distribution function (PDF) and gives a dynamic approach for statistical timing analysis, which is used for dynamic frequency management to improve performance of both error-resilient and error-sensitive applications. To this aim, we introduce a metric called architecture timing-fault vulnerability factor, considering NBTI and $V_{\text {dd}}$ effects. Simulation results show that the proposed timing slack PDF estimation model has an accuracy of about 94%, which can be used to increase throughput of error-resilient applications up to 3.2 times compared with when the traditional STA is used.