Abstract
The semiconductor devices (especially integrated circuits/chips) test field involves a wide range of device types and test parameters, which leads to low development efficiency, poor stability, weak reuse, long development cycle and repetitive work in application development. Therefore, a test application development method based on reusable component technology is proposed in this paper. Firstly, this paper introduces the basic concepts and characteristics of the reusable component technology. Then, according to the current situation of semiconductor device testing, the design method of component-based test application program is described. Finally, the typical semiconductor device test application program is designed and developed by using LabWindows/CVI integrated development environment. Practice has proved that the component-based test application program design can speed up the R&D and ensure the software quality at the same time. The agile development requirement of application program for semiconductor device test system can be satisfied.
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