Abstract
Atomic force microscopy (AFM) and scanning tunnelling microscopy (STM) were used to investigate the surface of TiO2 ultrafiltration membranes with pore sizes of 10 nm. It is widely accepted that conventional AFM with Si3N4 or Si tips is not able to resolve pores in supported ceramic membranes with a diameter of <40 nm. In this study it should be tested whether it is possible to lower this border for further characterization of nanofiltration membranes. Here we present different ways of imaging and discuss alternative sample preparation techniques.© 1997 John Wiley & Sons, Ltd.
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