Atomic Force Microscopy in Optical Imaging and Characterization

Abstract

Atomic force microscopy (AFM) is a state of the art imaging system that uses a sharp probe to scan backwards and forwards over the surface of an object. The probe tip can have atomic dimensions, meaning that AFM can image the surface of an object at near atomic resolution. Two big advantages of AFM compared to other methods (for example scanning tunneling microscopy) are: the samples in AFM measurements do not need to be conducting because the AFM tip responds to interatomic forces, a cumulative effect of all electrons instead of tunneling current, and AFM can operate at much higher distance from the surface (5-15 nm), preventing damage to sensitive surfaces.