Abstract
Atomic force microscopy (AFM) investigating the sample morphology is the process of direct interaction between tip and surface features. The geometry of probe tip is a determining factor in correcting AFM images distorted by tip size itself. A quantitative knowledge of the current tip shape is needed to improve the reliability of AFM images. The biaxially oriented polypropylene (BOPP) film was fabricated and used as tip characterizer to estimate the morphology of AFM Si tip based on the blind reconstruction algorithm. The surface of the BOPP film was covered by nanometer-scale-sized structures which ensure that the tip profile can be determined accurately. Without independent knowledge of the sample, the three-dimensional (3D) shape of Si probe tip was obtained with high aspect ratio. BOPP film is not only a simple, cheap material but also a soft one which can also avoid tip damage in scanning. It was demonstrated reliable and suitable for tip characterization.
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