Abstract
A sound methodology is required for quantitative analytical electron microscopy (AEM) of the complex intergranular phases found in many structural ceramics. Such phases have been studied in a sintered silicon nitride ceramic by combination of energy-dispersive X-ray analysis (EDS) and two methods of electron energy loss (EEL) spectral collection. The reliability of these analytical techniques in identifying crystalline devitrification products and providing accurate glass compositions is discussed in terms of system and specimen artefacts, ease of spectral processing and reliability of quantification factors.
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