Adaptive Correction Method of Uneven Intensity in Fourier Ptychographic Microscopy

Abstract

Fourier ptychographic microscopy (FPM) is a computational imaging technique that combines a large field of view and high-resolution. It stitches low-resolution images captured under varying illumination corresponding to different angles in the frequency domain to realize quantitative phase imaging with high spatial bandwidth product. Our previous algorithm (AA algorithm) effectively solves the problem of noise interference and the algorithm is difficult to converge. In FPM experiments, the fluctuation of LED intensity is inevitable, which significantly affects the quality of reconstructed images. The usual solution is to perform intensity correction in the reconstruction algorithm. However, in this study, it is found that the AA algorithm is incompatible with the intensity correction method, which will decrease the convergence performance. To solve this problem, we develop a more general reconstruction algorithm based on the AA algorithm in this study. The simulation and experimental results show that the improved algorithm framework is compatible with the intensity correction method, resulting in an increase in intensity correction reliability and effectiveness. Compared with the GS and AS methods with intensity correction, the error in reconstruction results can be reduced by 52.03% and 29.35%, respectively, without increasing the amount of calculation.