Abstract
This paper presents a new approach to the accurate determination of the far-field (FF) pattern of wide-angle scanning phased array antennas (PAAs) that uses planar near-field (NF) technology. When PAAs are engaged in wide-angle scanning, a finite scanning plane and inaccurate probe compensation can lead to truncation errors. The proposed approach reduces these by rotating the PAA to make its main beam perpendicular to the scanning plane. To verify the effectiveness of the approach, both theoretical calculations and actual measurements were undertaken. The simulated and measured results prove that the proposed method is more accurate than traditional NF technology for a large PAA scanning angle, such as ψ0=50° and Δ0=50° (in simulation; 54° when measured).
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