Abstract
This paper presents a new approach to the accurate determination of the far-field (FF) pattern of wide-angle scanning phased array antennas (PAAs) that uses planar near-field (NF) technology. When PAAs are engaged in wide-angle scanning, a finite scanning plane and inaccurate probe compensation can lead to truncation errors. The proposed approach reduces these by rotating the PAA to make its main beam perpendicular to the scanning plane. To verify the effectiveness of the approach, both theoretical calculations and actual measurements were undertaken. The simulated and measured results prove that the proposed method is more accurate than traditional NF technology for a large PAA scanning angle, such as ψ0=50° and Δ0=50° (in simulation; 54° when measured).
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.