Abstract
Mechanisms of the radiation-induced development of nanostructures in subsurface metal regions have been analyzed based on field-ion microscopy data. It is concluded that the modification of near-surface metal regions on a nanometer scale as a result of the interaction with Ar+ ion beams proceeds by several mechanisms. In particular, for a fluence of F = 1016 ion/cm2 (at an ion energy of E = 30 keV), the main contribution is due to the ion channeling. A tenfold increase in the ion fluence leads to prevailing deformation mechanism in nanostructure formation in the subsurface metal regions.
Highlights
As is known, the interaction of accelerated ions with substances leads to the formation of special condensed states in irradiated targets and, unique strength and other physical properties of ionmodified materials
The ion-implanted points were again placed into the field ion microscope, and sequential field-ion microscopy (FIM) images were recorded during controlled removal of atomic layers
The initial (FIM-attested) samples prior to irradiation had an atomically smooth surface of the emitter tip with a nearly hemispherical shape. This surface was obtained in situ due to field evaporation of the surface atoms
Summary
Journal of Physics: Conference Series 755 (2016) 011001 doi:10.1088/1742-6596/755/1/011001. Amundsena 106, Ekaterinburg, 620016, Russia Yeltsin Ural Federal University, Yekaterinburg, 620002 Russia
Sign-in/Register to view highlights & summary Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: IOP Conference Series: Materials Science and Engineering
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
