Abstract
Modes of radiation exposure for development of amorphized states in subsurface regions of platinum are determined. Diagnostics of the irradiated structure was carried out using the field ion microscopy technique. It is shown that radiation exposure of pure metals with an energy of E = 30 keV under variation of the fluence of the charged argon ion beams by two orders of magnitude (1016 to 1018 ions/cm2) produces a significant effect on the kinetics of defect formation in the subsurface regions of irradiated materials. It is found that the phenomenon of metal amorphization in the subsurface regions occurs up to a sample depth of 12 nm under an increase in the fluence to 1018 ions/cm2 and the above irradiation energies.
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