Abstract
Synchrotron x-ray topography has been used to study structural defects in CdTe crystals. Substrates from six commercial sources as well as crystals grown in our own laboratory by the vertical Bridgman method were studied. X-ray topography is known to be very sensitive to lattice strain and it reveals a broad range of defects. Extensive subgrain structure was detected in virtually all substrate material studied, in basic agreement with chemical etching, cathodoluminescence, and double crystal rocking curve (DCRC) analysis. Dislocations, dislocation tangling, and microprecipitates were revealed as well. In addition, we found extensive slip systems and large, long-range misorientations (average 200–500 arc s). These findings suggest there may be serious problems with mechanical and/or thermal stresses during the growth of CdTe. We also include results from preliminary studies on ZnCdTe substrates.
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