Abstract

Abstract : Considerable progress was made in two areas: (1) Better understanding of flicker noise in MOSFETs. (2) Better understanding of hot electron noise in JFETs. In addition, considerable clarification was obtained in the understanding of flicker noise problems in general. This report summarizes the research efforts in the above areas. (Author)

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call