Abstract
We prepared a bright and transparent Zn2SiO4:Mn2+ phosphor film using a simple method through a thermally diffused reaction between quartz (SiO2) substrate and spin-coated ZnO:Mn thin film on a quartz (SiO2) substrate. From X-ray diffraction patterns, our samples revealed some preferred crystal orientations which have (113)-, (223)-, and (333)-crystal planes. Our best sample (Mn/Zn=5at %) showed 40% brightness compared to the commercial powder product under 146nm excitation and it has a short decay time of 4.5ms under 254nm excitation. In addition, transmittance of our film revealed 60% at 525nm wavelength range. These excellent luminescent and optical properties can be explained by morphology of the interface and the unique crystal structure of our Zn2SiO4:Mn2+ film.
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