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https://doi.org/10.1016/0167-2738(88)90232-9
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Cite Journal: Solid State Ionics |  Publication Date: Apr 1, 1988 |
Affiliation: École Polytechnique, Institut Polytechnique de Paris
A simple method with three electrodes has been used to measure the diffusion coefficient of the mobile Cu + ion in the mixed conductor Cu 3VS 4 on the basis of the ambipolar diffusion theory. By this method we find that the diffusion coefficient is about 1×10 −7 cm 2/s at 300K with an activation energy of 0.44eV.
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