Abstract

In this article, a Schmitt trigger based 12-Transistors(ST12T) static random-access memory (SRAM) bit-cell has been proposed. The Read Power of proposed cell is reduced by 29.17%/ 24.14% /7.66% /5.87% /7.67% /16.62% when compared to 6T/ 7T/ TA8T/ 9T/ PPN10T/ D2p11T SRAM cells. Proposed ST12T cell also shows 1.52 $$\times$$ and 1.86 $$\times$$ lesser variability in read current and read power respectively as compared to conventional 6T SRAM cell. Further, the write access time/read access time of the proposed topology are improved by $$1.71 \times /1.82 \times$$ as compared to 6T SRAM cell. The read power delay product of proposed ST12T cell is minimum with variation in supply voltage from 0.5 to 1 V when compared with all considered SRAM cells. ST12T SRAM cell also exhibits 26.82% and 8.87% higher read static noise margin and write static noise margin respectively as compared to conventional 6T SRAM cell. This may be attributed to Schmitt trigger design of inverters in core latch of proposed SRAM cell. The proposed bit-cell is free from half select issue and supports bit interleaving format. Authors have used cadence virtuoso tool with Generic Process Design Kit 45 nm technology file to carry out simulation.

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