Abstract
CMOS Active pixel sensors (CMOS APS) are attractive for use in the innermost layers of charged particle trackers, due to their good tradeoffs among the key performances. However, CMOS APS can be greatly influenced by random telegraph signal (RTS) noise, which can cause particle tracking or energy calculation failures. In-depth research of pixels' RTS behavior stimulates the interest of the methods for RTS noise detection, reconstruction and parameters extraction. In this paper, a real-time auto-detection method is proposed, using real-time Gaussian noise standard deviation as the detection threshold. Experimental results show that, compared with current methods using signal standard deviation as the thresholds, the proposed method is more sensitive in multi-level RTS detection and more effective in the case of RTS noise degradation.
Published Version
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