Abstract
Two procedures are presented for generating fault detection test sequences for large sequential circuits. In the adaptive random procedure one can achieve a tradeoff between test generation time, length, and percent of circuit tested. An algorithmic path-sensitizing procedure is also presented. Both procedures employ a three-valued logic system. Some experimental results are given.
Full Text
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call