Abstract
A new nucleation-site-control method has been proposed for excimer-laser crystallization, where a cross-coupled phase shifter is placed on the sample surface. High thermal conductivity of molten Si flattens its temperature distribution shortly after laser-light irradiation, and, in turn, confines a low-temperature Si region to a very narrow area. Since nucleation can take place only in this narrow area of unmolten Si, not only is the number of nuclei limited to unity, but also the position of a nucleus can be determined. The usefulness of the proposed method is investigated theoretically and experimentally. A single grain as long as 5 µm in diameter was formed at the desired position.
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