Abstract
The unexpectedly narrow width Γ p = 120 eV or Γ N 15 = 1.8 keV of this resonance opens quite new possibilities for its use in 15N or 1H depth location and for hydrogen adsorption studies using 15N beams. Resonance depth profiling of 15N is possible with much better near-surface depth resolution than thought until recently. In 1H resonance depth profiling the indeep background originating from the surface contamination peak is also much smaller than previously assumed. These features are illustrated by 15N self-diffusion experiments in NbN films and by 15N adsorption experiments on copper single crystals in ultrahigh vacuum. The strong effect of Doppler broadening on the actual ultimate near-surface depth resolution of hydrogen depth profiling with 15N beams is discussed as well as the use of this resonance for the direct measurement, based on the Doppler effect, of the vibration speed distribution of hydrogen atoms adsorbed on clean surfaces.
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