Single Layer Graphene for Estimation of Axial Spatial Resolution in Confocal Raman Microscopy Depth Profiling.

Abstract

Single layer graphene (SLG), with its angstrom-scale thickness and strong Raman scattering cross section, was adapted for measurement of the axial ( Z-direction) probe beam profile in confocal Raman microscopy depth-profiling experiments. SLG adsorbed to a glass microscope coverslip (SLG/SiO2) served as a platform for the estimation of axial spatial resolution. Profiles were measured by stepping the confocal probe volume through the SLG/SiO2 interface while measuring Raman scattering from the sample. Using a high numerical aperture (1.4 NA) oil immersion objective, axial profiles were derived from the graphene 2D vibrational mode and fit to a Lorentzian instrument response function (IRF). Subsequently, the Z-direction spatial resolution in depth-profiling studies of polymer interfaces was estimated through convolution of the Lorentzian IRF with a step function representing the ideal junction separating the phases of interest. In the study of a bipolar polymer membrane, confocal Raman depth profiles of the AEM/CEM (anion exchange membrane/cation exchange membrane) interface show that the transition region is broader than the limiting response and are consistent with roughness at the boundary on the order of a few micrometers. Using ClO4- as a Raman active mobile ion probe, application of self-modeling curve resolution (SMCR) to spectral data sets within a profile showed ClO4- ions track the spatial distribution of the AEM phase. Finally, in measurements on a liquid-solid interface formed between 1-octanol and a polydimethylsiloxane (PDMS) membrane, the IRF derived from fitting the experimental profile was slightly narrower than those obtained from profiling SLG, indicating the potential to use polymer-liquid interfaces formed from widely available materials and reagents for estimation of axial spatial resolution in confocal Raman depth-profiling.