A new life for the wavelength-dispersive X-ray spectrometer (WDS): incorporation of a silicon drift detector into the WDS for improved quantification and X-ray mapping

Abstract

The wavelength-dispersive X-ray spectrometer (WDS) has been around for a long time and the design has not changed much since its original development. The electron microprobe operator using WDS has to be meticulous in monitoring items such as gas flow, gas purity, gas pressure, noise levels of baseline and window, gas flow proportional counter (GFPC) voltage levels, count rate suppression, anode wire contamination and other detector parameters.Recent development and improvements of silicon drift detectors (SDD’s) has allowed the incorporation of a SDD as the X-ray detector in place of the proportional counter (PC) and/or gas flow proportional counter (GFPC). This allows minimal mechanical alteration and no loss of movement range.The superiority of a WDS with a SDD, referred to as SD-WDS, is easily seen once in operation. The SD-WDS removes many artefacts including the worse of all high order diffraction, thus allowing more accurate analysis. The incorporation of the SDD has been found to improve the light and mid element range and consequently improving the detection limit for these elements. It is also possible to obtain much more reliable results at high count rates with almost no change in resolution, gain and zero-peak characteristics of the energy spectrum.