Abstract
This paper presents a sensitivity-based test generation tool for analog multifrequency testing. This tool generates minimal test sets that maximize the coverage of soft, large and hard component faults and enhance the coverage of interconnect shorts. The test generation procedure is illustrated for a low-pass biquad filter. This procedure is now being automated by integrating commercially available tools for symbolic computation and electrical simulation.KeywordsComputer-Aided TestingAutomatic Test GenerationAnalog and Mixed-signal Circuits
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