Abstract
AbstractIn this paper the problem of fault diagnosis in analogue circuits is addressed by a method which can be regarded as an artificial intelligence approach. the topology of the circuit under test along with the nominal element values, the necessary element models and their possible failure modes are the basic tools used in the procedure. Fault location is accomplished using appropriate DC node voltage measurements under certain DC excitations on the nominal circuit and the faulty one. the detection of signal faults which have DC effects is the goal of the method; cases of faults with non‐DC effects are also examined. Demonstrative examples are given to show the applicability of the method on passive and active analogue circuits.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
