A New Analyzing Method of Single Event Latch-Up Protection Circuit Based on Current Comparing and Its Performance Verification

Pengwei Li,Qingkui Yu,Xiaoyun Fu,Lei Luo

doi:10.4236/jmp.2014.56050

Abstract

Single event latch-up (SEL) is a significant issue for electronics design in space application, which would cause large currents in electronic devices, and may lead to burning out of devices. A new monitoring circuit based on current-comparing method is designed to protect the electronics away from SEL’s damage in radiation environment. The response time of protection circuit has been analyzed. The signal simulation results indicated that the operating time of the SEL protection circuit is dependent on the action time of current comparator and system application recovery time. The function of the monitoring circuit protection device away from SEL’s damage has validated through experiment at last.

Highlights

With the development of satellite technologies, there has been highly increasing demand for lower power and more cost-effective spacecrafts
Since there is no radiation hardened technology applied in manufacture of (COTS) electronics, COTS technologies are
In order to reduce the risk of using COTS components in space application, radiation hardening techniques need to be taken

Summary

Introduction

With the development of satellite technologies, there has been highly increasing demand for lower power and more cost-effective spacecrafts For this reason, more and more spacecrafts try to employ commercial-off-theshelf (COTS) electronics, due to the high performance, short delivery time and low cost [1] [2]. SEL is extremely hazardous to electronics in space environment, causing permanent damage to electronics or hardware in an ultra-short time due to the emergence of high currents [6] [7]. These permanent damages can induce partial malfunction or instrument failure of spacecrafts [8] [9]. A removal of power from the device is required in all non-catastrophic SEL conditions in order to recover device operations

Methods

Discussion

Conclusion