A Hierarchical Bayes Analysis and Comparison of PH Weibull and PH Exponential Models for One-Shot Device Testing Experiment

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The one-shot devices are highly reliable and, therefore, accelerated life tests are often employed to perform the experiments on such devices. Obviously, in the process, some covariates are introduced. This paper considers the proportional hazards model to observe the effect of covariates on the failure rates under the assumption of two commonly used models, namely the exponential and the Weibull for the lifetimes. The Bayes implementation is proposed using the hybridization of Gibbs and Metropolis algorithms that routinely extend to missing data situations as well. The entertained models are compared using the Bayesian and deviance information criteria and the expected posterior predictive loss criterion. Finally, the results based on two real data examples are given as an illustration.