Abstract
The first crystal x-ray polarimeter to be used for x-ray astronomy is described. Polarization is measured by modulation of the x rays diffracted at an average 45° glancing angle from large, curved graphite crystal panels as these rotate about an axis parallel to the incident x-ray flux. Arrangement of the crystal panels, the design of the detector, and the signal-processing circuitry were optimized to minimize systematic effects produced by off-axis pointing of the rocket and cosmic ray induced events. The in-flight performance of the instrument in relation to the observed background signal is discussed.
Published Version
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