A fast and accurate fault injection platform for SRAM-based FPGAs

Abstract

SRAM-based FPGAs have a wide application in space because of the reconfigurability and high-capacity. However, single event upset (SEU) induced by cosmic ray which can induce an error function of user design in FPGA seriously imperils the safety of their applications in space. So evaluating the sensitivity to SEU of user design in FPGA becomes very important. This paper proposed a fast and accurate fault injection platform to evaluate the sensitivity to SEU of user design in FPGA. An optimized address generator was designed for the proposed fault injection platform that can speed up the fault injection and make the results of fault injection more accurate. We tested the fault injection platform with some ISCAS85 benchmark circuits.