Abstract

An effective method is proposed to reduce dynamic power for synchronous 2-read/write (2RW) 8T dual-port (DP) SRAM. Adjusting the wordline (WL) pulse timing control circuit is newly introduced for both reading and writing operations. Row addresses of port-A and port-B are compared. The same row access is detected or not in each cycle, which is an inherent access mode of 2RW 8T DP SRAM. In different row access, the WL pulse width is shortened to reduce excessive bitline (BL) discharging power. A well balanced 8T DP SRAM bitcell layout is demonstrated using 40-nm technology. A test chip including 512 w × 73 b 36 kbit and 2 kw × 19 b (38 kbit) 2RW DP SRAM macros was designed and fabricated using 40-nm technology. The measured data show that reading and writing powers are reduced, respectively, by ∼7% and ∼18% using the proposed scheme.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.