A DSP Chip IO Fault Injection Method Based on Boundary Scan Technology

Abstract

As a type of VLSI, the DSP chip has been widely used in avionics systems where its application can effectively improve the integration of avionics systems. In the testability test, this high level of integration leads to a reduction in the operability of fault injection. To counter this limitation, a DSP chip IO fault injection technique based on boundary scan is proposed. Firstly, the real-time data of the fault injection object is captured through a boundary scan chain. Next, the fault injection data sequence is generated in combination with the control instruction, and these data sequences are written into the boundary scan chain register. Finally, these data are updated to the IO pins of the fault injection object and these pins controlled to generate logic changes and complete the fault injection. The experimental results show that the method is simple to operate and is not affected by the package and structure of the DSP chip; it can effectively improve fault injection efficiency.