Abstract

We present a cryogenic method for testing of thermal radiative properties of materials commonly used in ground-based systems as well as for space probes. It is possible to measure total hemispherical emissivity or absorptivity of metallic or dielectric surfaces (0.1% - 100%) in the range of temperatures from 10 K up to 320 K of the source of thermal radiation. Emissivity of thermal control coatings for the space probe JUICE are presented together with other materials used for space exploration or cryogenics.

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