A computer-aided simulation model for the I–V characteristic of M- n- p silicon Schottky-barrier diodes produced by use of low-energy arsenic-ion implantation

Abstract

Current-transport properties of Al-n-p silicon Schottky-barrier diodes have been studied both experimentally and theoretically. An analytical model for the I-V characteristic of a metal- n- p Schottky barrier diode has been developed by using an interfacial layer-thermionic-diffusion model. Assuming a Gaussian distribution for the implanted profile, the barrier-height enhancement and ideality factor have been derived analytically. Using low energy (25 KeV) arsenic implantation with the dose ranged form 8 × 10 10/cm 2 to 10 12/cm 2, Al- n- p silicon Schottky barrier diodes have been fabricated and characterized. Comparisons between the experimental measurements and the results of computer simulations have been performed and satisfactory agreements between these comparisons have been obtained. The reverse I–V characteristics of the fabricated Al- n- p silicon Schottky barrier diodes can also be well simulated by the developed model.