Abstract
A computer-controlled system was set up for the measurement of deep levels in semiconductors. It has a custom-designed interface card to establish communications between necessary instruments and a personal computer. The card enables the system to have a maximum sampling rate of 20000 sample/s. Comparisons were made between the present system and those of other workers. The system is very versatile as its function is solely determined by software programs; different techniques like DLTS (deep-level transient spectroscopy) and TSCAP (thermally stimulated capacitance measurement) can be used on the same setup by developing different programs. The system was applied to the study of deep traps in Si produced as a result of pulsed-laser irradiation. An electron deep trap level of 0.22 eV below the conduction band was found.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: IEEE Transactions on Instrumentation and Measurement
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
