A comprehensive analysis on the resilience of adiabatic logic families against transient faults

Abstract

With the emergence of various battery operated technologies in different computing domains and the challenge of heating in such technologies, the issue of energy dissipation has become more critical than ever before. In such systems, energy constraints in one hand, and heat generation, on the other hand, necessitates the employment of energy efficient technologies in the fabrication of digital circuits. One possible solution for mitigating the energy dissipation in digital circuits is the use of adiabatic families in the process of designing computing devices. Adiabatic circuits are designed mainly based on the principles of thermodynamics and provide a paradigm shift in the design of digital systems. Nevertheless, their impact on the reliability of digital circuits due to susceptibility to soft errors has not been explored comprehensively. In this paper, we first try to survey some existing adiabatic logic families. Then we attempt to evaluate their reliability by validating their functionality under the effect of soft errors. Our evaluations which were conducted on a set of SPICE simulations have shown that amongst SCRL, 2LAL, RERL, PFAL, 2N2N2P and ECRL families the ECRL family is able to tolerate more than 90% of the injected transient faults and the applications with a high demand of reliability can use this family of adiabatic circuits. Furthermore, we will propose some suggestions for establishing reliable computations through adiabatic circuits.