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https://doi.org/10.1109/tmtt.1981.1130313
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Cite Publication Date: Feb 1, 1981 | |
 Citations: 14 |
The theory of an optimum 5-port network for measuring complex reflection and transmission coefficients is developed. A compact realization in waveguide is described which allows these quantities to be determined over waveguide bandwidths from the measurements of two referenced power levels.
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