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https://doi.org/10.1007/s10836-021-05972-y
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Cite Journal: Journal of Electronic Testing |  Publication Date: Dec 1, 2021 |
 Citations: 2 |
Affiliation: Toyama Prefectural University, Kyoto Institute of Technology
A Bit-Error Rate Measurement and Error Analysis of Wireline Data Transmission using Current Source Model for Single Event Effect under Irradiation Environment
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