A 0.506-pJ 16-kb 8T SRAM With Vertical Read Wordlines and Selective Dual Split Power Lines

Abstract

This article presents an 8T static random access memory (SRAM) macro with vertical read wordline (RWL) and selective dual split power (SDSP) lines techniques. The proposed vertical RWL reduces dynamic energy consumption during read operation by charging and discharging only selected read bitlines (RBLs). The data-aware SDSP technique combined with vertical write bitlines enhances both the write margin (WM) and the static noise margin (SNM). A 16-kb SRAM test chip fabricated in 65-nm CMOS technology demonstrates the minimum energy consumption of 0.506 pJ at 0.4 V and the minimum operating voltage of 0.26 V.