81‐1: Invited Paper: Data Augmentation for Applying Deep Learning to Display Manufacturing Defect Detection

Abstract

Insufficient and imbalance data samples often prevent the development of accurate deep learning models for manufacturing defect detection. By applying data augmentation methods ‐ including VAE latent space oversampling and random data generation, and GAN multi‐modal complementary data generation, we overcome the dataset limitations and achieve Pass/No‐Pass accuracies of over 90%.