54.4: Study on the Dark‐state Light Leakage Mechanism of LCD Splicing Screen

Abstract

While the narrow bezel technology has gradually become one of the necessary technologies for LCD splicing screen products to improve their competitiveness, it also brings the problem of peripheral light leakage to the LCD splicing screen in the dark state. In order to quantify the level of peripheral light leakage in the dark state and propose corresponding improvement measures, this paper proposes a characterization method and test plan for light leakage sensitivity. The experimental results show that the characterization method can correctly reflect the light leakage level of the LCD splicing screen in the dark state.