Abstract
The purpose of this chapter is to focus on the surface metrology, and different ways of its manufacturing and measurement. The surface can be used to assess all aspects of quality progress in manufacture. The surface texture can be used to have a check on the process, but there are a number of issues to consider: where to measure, when to measure, and what to measure. In order to control the process such that changes can be detected quickly and effectively, simple parameters such as Ra or Rz can be used. The number of parameters could be measured and displayed in process. Several processes are categorized in the process and surface finish, namely: turning, diamond turning, milling and broaching, general abrasive process and surface finish, grinding and surface finish, nano-grinding, honing and superfinishing, polishing (lapping), unconventional machining, and atomic bit processes. The process control can be achieved by using critical parameter of the workpiece. Control using the measured parameter is achieved by means of the Shewhart charts and Cumulative charts. The cumulative-sum method is to plot the accumulation of the Ra values. Some of the parameters are need to be used to monitor and prevent machine tool problems from developing. If the function is understood and the process is controlled, no metrology would be required. Once the measurements are made on the specimen, these are then plotted on a Shewhart chart, Cumulative chart, or any other control method. Hence, there is so much “capability” in the system that no measurement is needed as the link-up between manufacture and use has been properly made.
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call