Abstract

An instrument that incorporates two scanning tunneling microscope (STM) tips which can have their tunnel junctions as close together as a few nanometers was designed and built. The sample is fixed and can be imaged simultaneously and independently with both STM tips. The tips and sample can be positioned and angled to image the same surface or perpendicular surfaces. The entire STM head is cooled with liquid helium to about 4K while in an ultrahigh vacuum environment. Macroscopic positioning of the tips is accomplished using piezoelectric “stick-slip” coarse motion stages, whereas atomic positioning is accomplished with piezoelectric tube scanners. This instrument addresses the critical need to locally characterize individual nanostructures and heterostructures.

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