Abstract
This paper consists of two parts. The first part is a survey of Three-Dimensional (3-D) VLSI technology which is considered to be one of the leading areas among the integrated circuit technologies in the next century. Furthermore the researches of 3-D VLSI in Japan are summarized as well. In the second part of this paper, as a case study, the features of 3-D VLSI are exhibited by testing various layouts of syndrome decoder for double-error correction of linear codes, which can be used for example to improve the reliability of main memories. By the layout results of DEC-BCH decoder, material as well as time savings using 3-D VLSI technology compared to the conventional 2-D VLSI technology are shown.
Published Version
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