Abstract
The observed dependence of the $\frac{1}{f}$ noise in metal films on the temperature coefficient of resistance and on sample volume, and the observation of frequency-dependent spatial correlations of the noise, suggest the noise is due to a thermal-diffusion mechanism. The assumption of a spectrum for the intrinsic temperature fluctuations with an explicit $\frac{1}{f}$ region, and the condition $〈{(\ensuremath{\Delta}T)}^{2}〉=\frac{k{T}^{2}}{{C}_{V}}$, yield quantitative predictions of the noise power in excellent agreement with experiment.
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