Abstract

Error correcting codes (ECCs) are commonly used to protect against the soft errors. Single error correcting and double error detecting (SEC-DED) codes are generally used for this purpose. The proposed approach in this paper selectively reduced power consumption, delay, and area in single-error correcting, double error-detecting checker circuits that perform memory error correction. The multi-objective genetic algorithm is employed to solve the non -linear optimization problem. The proposed method allows that user can choose one of different non-dominated solutions depending on which consideration is important among them. Because we use multi-objective genetic algorithm, we can find various dominated solutions. Therefore, we can choose the ECC according to the important factor of the power, delay and area. The method is applied to odd-column weight Hsiao code which is well- known ECC code and experiments were performed to show the performance of the proposed method.

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