Рентгенолюминесценция пленок ZnO толщиной более 100 μm

Abstract

For the first time, the work presents a thin-film X-ray scintillator based on ZnO with a thickness of more than 100 μm with luminescence decay kinetics of the order of 1.1 ns (including the width of the exciting pulse). The absorption edge of the film scintillator is shown to be located in the region 388 nm. The total transmittance of the sample in the visible and near infrared region reaches 40%. The X-ray luminescence spectrum is represented by two intense bands: a narrow band of excitonic nature with a maximum in the region of 389 nm and a wide band of green luminescence related to intrinsic defects.