Abstract
The article considers the influence of linear and bending stresses on the magnitude of the internal field and self-polarisation in thin lead zirconate titanate (PZT) films formed on silicon and glass-ceramic ST-50 substrates by radio-frequency magnetron sputtering. PZT composition corresponded to the region of the morphotropic phase boundary. It is assumed that bending stresses in “thin PZT film-substrate” bimorph structures lead to the appearance of an internal electric field caused by the diffusion of charged oxygen vacancies (Gorsky effect in ferroelectrics).
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