Abstract
Thin lead zirconate-titanate (PZT) films have been synthesized on MgO(100) using the tripole magnetron sputtering system. This system makes it possible to sputter lead and zirconium-titanium alternately. Lead concentration in the deposited films can be easily adjusted to near stoichiometry through the control of substrate temperature. The c-axis-oriented films with perovskite structure of Morphotropic Phase Boundary composition were obtained at 550°C via the self-limiting process of lead concentration. The formation process of thin PZT films has been investigated with reference to the observed results of the dependence of the crystal structure on Zr/Ti ratio as well as lead concentration in the films.
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